Jay S. Burnham

Publication Activity (10 Years)

Years Active: 1999-2005
Publications (10 Years): 0

Publications

Terence B. Hook, Ronald J. Bolam, William Clark, Jay S. Burnham, Nivo Rovedo, Laura Schutz
Negative bias temperature instability on three oxide thicknesses (1.4/2.2/5.2 nm) with nitridation variations and deuteration. Microelectron. Reliab. 45 (1) (2005)
Terence B. Hook, Jay S. Burnham, Ronald J. Bolam
Nitrided gate oxides for 3.3-V logic application: Reliability and device design considerations. IBM J. Res. Dev. 43 (3) (1999)