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Nitrided gate oxides for 3.3-V logic application: Reliability and device design considerations.

Terence B. HookJay S. BurnhamRonald J. Bolam
Published in: IBM J. Res. Dev. (1999)
Keyphrases
  • design considerations
  • classical logic
  • random access memory
  • neural network
  • machine learning
  • high speed