Rafic Z. Makki

Publication Activity (10 Years)

Years Active: 1986-2018
Publications (10 Years): 1

Top Topics

Information Infrastructure

Emerging Technologies

Top Venues

Publications

Rafic Z. Makki, Victor V. Zhirnov, Ralph K. Cavin III, Sami Issa, Marco Iansiti
Nurturing the Growth of a National Infrastructure in Emerging Technologies. Proc. IEEE 106 (7) (2018)
Valeriu Beiu, Walid Ibrahim, Rafic Z. Makki
On Wires Holding a Handful of Electrons. NanoNet (2009)
Ali Chehab, Saurabh Patel, Rafic Z. Makki
Test Methods for Random Logic Circuits. J. Electron. Test. 22 (1) (2006)
Scott Thomas, Rafic Z. Makki, Sai Kishore Vavilala
Measurement and Analysis of Physical Defects for Dynamic Supply Current Testing. DELTA (2004)
Suriya Ashok Kumar, Rafic Z. Makki, David M. Binkley
Testing of Embedded CMOS SRAMs. DATE (2002)
Ali Chehab, Rafic Z. Makki, Michael Spica, David Wu
IDDT Test Methodologies for Very Deep Sub-micron CMOS Circuits. DELTA (2002)
Jian Liu, Rafic Z. Makki, Ayman I. Kayssi
Dynamic Power Supply Current Testing of CMOS SRAMs. J. Electron. Test. 16 (5) (2000)
Rafic Z. Makki
Testing of Embedded Memories - The Aggregate. Asian Test Symposium (1998)
Jian Liu, Rafic Z. Makki, Ayman I. Kayssi
Dynamic Power Supply Current Testing of SRAMs. Asian Test Symposium (1998)
Abdulnour Y. Toukmaji, Ronald Helms, Rafic Z. Makki, Wadie Mikhail, Patrick Toole
Testing Experiments for Various CMOS Logic Design Structures. VLSI Design 5 (3) (1997)
Rafic Z. Makki
Advancements in Power Supply Current Testing. VLSI Design 5 (3) (1997)
Jian Liu, Rafic Z. Makki
Power supply current detectability of SRAM defects. Asian Test Symposium (1995)
Rafic Z. Makki, Shyang-Tai Su, H. Troy Nagle
Transient Power Supply Current Testing of Digital CMOS Circuits. ITC (1995)
Shyang-Tai Su, Rafic Z. Makki, H. Troy Nagle
Transient power supply current monitoring - A new test method for CMOS VLSI circuits. J. Electron. Test. 6 (1) (1995)
Subbu Muddappa, Rafic Z. Makki, Zbigniew Michalewicz, Sridhar Isukapalli
Pioneer: A New Tool for Coding of Multi-Level Finite State Machines Based on Evolution Programming. VLSI Design 2 (2) (1994)
Rafic Z. Makki, Shyang-Tai Su
Analysis and Characterization of State Assignment Techniques for Sequential Machines. VLSI Design 2 (1) (1994)
Shyang-Tai Su, Rafic Z. Makki
A testable static RAM structure for efficient coverage of pattern sensitive faults. VTS (1992)
Shyang-Tai Su, Rafic Z. Makki
Testing of static random access memories by monitoring dynamic power supply current. J. Electron. Test. 3 (3) (1992)
Rafic Z. Makki, Silvio Bou-Ghazale, Chen Tianshang
Automatic Test Pattern Generation with Branch Testing. IEEE Trans. Computers 40 (6) (1991)
Rafic Z. Makki, Kasra Daneshvar, Farid Tranjan, Richard Greene
On the Integration of Design and Manufacturing for Improved Testability. ITC (1991)
Rafic Z. Makki, Krisbnm Palaniswami
Practical partitioning for testability with time-shared boundary scan. ITC (1990)
Rafic Z. Makki, J. Muha, Silvio Bou-Ghazale, T. Kaylani
SSC-a tool for the synthesis of testable sequential machines. Compcon (1990)
Rafic Z. Makki, C. Tiansheng
Designing Testable Control Paths with Multiple and Feedback Scan-Paths. ITC (1986)