Shyang-Tai Su

Publication Activity (10 Years)

Years Active: 1992-1995
Publications (10 Years): 0

Publications

Rafic Z. Makki, Shyang-Tai Su, H. Troy Nagle
Transient Power Supply Current Testing of Digital CMOS Circuits. ITC (1995)
Shyang-Tai Su, Rafic Z. Makki, H. Troy Nagle
Transient power supply current monitoring - A new test method for CMOS VLSI circuits. J. Electron. Test. 6 (1) (1995)
Rafic Z. Makki, Shyang-Tai Su
Analysis and Characterization of State Assignment Techniques for Sequential Machines. VLSI Design 2 (1) (1994)
Shyang-Tai Su, Rafic Z. Makki
A testable static RAM structure for efficient coverage of pattern sensitive faults. VTS (1992)
Shyang-Tai Su, Rafic Z. Makki
Testing of static random access memories by monitoring dynamic power supply current. J. Electron. Test. 3 (3) (1992)