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Testing of static random access memories by monitoring dynamic power supply current.

Shyang-Tai SuRafic Z. Makki
Published in: J. Electron. Test. (1992)
Keyphrases
  • random access
  • power supply
  • health monitoring
  • real time
  • monitoring system
  • intelligent control
  • memory size
  • cloud computing
  • high frequency
  • evolutionary algorithm
  • control unit
  • electrical power