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IDDT Test Methodologies for Very Deep Sub-micron CMOS Circuits.

Ali ChehabRafic Z. MakkiMichael SpicaDavid Wu
Published in: DELTA (2002)
Keyphrases
  • micron cmos
  • artificial intelligence
  • high speed
  • neural network
  • database
  • databases
  • data mining
  • computer vision
  • website
  • statistical significance
  • digital circuits
  • delay insensitive