Philippe Debaud

Publication Activity (10 Years)

Years Active: 2016-2021
Publications (10 Years): 10

Top Topics

Cmos Image Sensor

Item Response Theory

Top Venues

J. Electron. Test.

Publications

J. Lefevre, Philippe Debaud, Patrick Girard, Arnaud Virazel
A Fast and Low Cost Embedded Test Solution for CMOS Image Sensors. ITC (2021)
Mahroo Zandrahimi, Philippe Debaud, Armand Castillejo, Zaid Al-Ars
Evaluation of the Impact of Technology Scaling on Delay Testing for Low-Cost AVS. J. Electron. Test. 35 (3) (2019)
Mahroo Zandrahimi, Philippe Debaud, Armand Castillejo, Zaid Al-Ars
An industrial case study of low cost adaptive voltage scaling using delay test patterns. DATE (2018)
Mahroo Zandrahimi, Philippe Debaud, Armand Castillejo, Zaid Al-Ars
Industrial evaluation of transition fault testing for cost effective offline adaptive voltage scaling. DATE (2018)
Mahroo Zandrahimi, Philippe Debaud, Armand Castillejo, Zaid Al-Ars
Cost Effective Adaptive Voltage Scaling Using Path Delay Fault Testing. EWDTS (2018)
Mahroo Zandrahimi, Philippe Debaud, Armand Castillejo, Zaid Al-Ars
Using transition fault test patterns for cost effective offline performance estimation. DTIS (2017)
Alberto Bosio, Philippe Debaud, Patrick Girard, Stephane Guilhot, Miroslav Valka, Arnaud Virazel
Auto-adaptive ultra-low power IC. DTIS (2016)
Mahroo Zandrahimi, Philippe Debaud, Armand Castillejo, Zaid Al-Ars
Industrial approaches for performance evaluation using on-chip monitors. IDT (2016)
Mahroo Zandrahimi, Zaid Al-Ars, Philippe Debaud, Armand Castillejo
Challenges of using on-chip performance monitors for process and environmental variation compensation. DATE (2016)
Miroslav Valka, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Philippe Debaud, Stephane Guilhot
Design for Test and Diagnosis of Power Switches. J. Circuits Syst. Comput. 25 (3) (2016)