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Evaluation of the Impact of Technology Scaling on Delay Testing for Low-Cost AVS.
Mahroo Zandrahimi
Philippe Debaud
Armand Castillejo
Zaid Al-Ars
Published in:
J. Electron. Test. (2019)
Keyphrases
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low cost
cost effective
data processing
evaluation model
low complexity
evaluation method
evaluation metrics
rapid development