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Michael P. Chudzik
Publication Activity (10 Years)
Years Active: 2012-2012
Publications (10 Years): 0
Top Topics
Gate Insulator
Leakage Current
Film Thickness
Power Line
Top Venues
Microelectron. Reliab.
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Publications
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Jiseok Kim
,
Siddarth A. Krishnan
,
Sudarshan Narayanan
,
Michael P. Chudzik
,
Massimo V. Fischetti
Thickness and temperature dependence of the leakage current in hafnium-based Si SOI MOSFETs.
Microelectron. Reliab.
52 (12) (2012)