Masuo Kajiyama

Publication Activity (10 Years)

Years Active: 2021-2024
Publications (10 Years): 7

Top Topics

Gaussian Process

Top Venues

IEICE Trans. Fundam. Electron. Commun. Comput. Sci.

Publications

Riaz-ul-haque Mian, Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki, Michihiro Shintani
Efficient Wafer-Level Spatial Variation Modeling for Multi-Site RF IC Testing. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 107 (8) (2024)
Takuma Nagao, Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki, Michiko Inoue, Michihiro Shintani
Wafer-Level Characteristic Variation Modeling Considering Systematic Discontinuous Effects. IEICE Trans. Fundam. Electron. Commun. Comput. Sci. 107 (1) (2024)
Makoto Eiki, Tomoki Nakamura, Masuo Kajiyama, Michiko Inoue, Takashi Sato, Michihiro Shintani
Improving Efficiency and Robustness of Gaussian Process Based Outlier Detection via Ensemble Learning. ITC (2023)
Takuma Nagao, Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki, Michiko Inoue, Michihiro Shintani
Wafer-Level Characteristic Variation Modeling Considering Systematic Discontinuous Effects. ASP-DAC (2023)
Makoto Eiki, Tomoki Nakamura, Masuo Kajiyama, Michiko Inoue, Michihiro Shintani
Accurate Failure Rate Prediction Based on Gaussian Process Using WAT Data. ITC (2022)
Michihiro Shintani, Riaz-ul-haque Mian, Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki, Michiko Inoue
Wafer-level Variation Modeling for Multi-site RF IC Testing via Hierarchical Gaussian Process. CoRR (2021)
Michihiro Shintani, Riaz-ul-haque Mian, Michiko Inoue, Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki
Wafer-level Variation Modeling for Multi-site RF IC Testing via Hierarchical Gaussian Process. ITC (2021)