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Efficient Wafer-Level Spatial Variation Modeling for Multi-Site RF IC Testing.
Riaz-ul-haque Mian
Tomoki Nakamura
Masuo Kajiyama
Makoto Eiki
Michihiro Shintani
Published in:
IEICE Trans. Fundam. Electron. Commun. Comput. Sci. (2024)
Keyphrases
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multi site
integrated circuit
cost effective
relevance feedback