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Wafer-Level Characteristic Variation Modeling Considering Systematic Discontinuous Effects.
Takuma Nagao
Tomoki Nakamura
Masuo Kajiyama
Makoto Eiki
Michiko Inoue
Michihiro Shintani
Published in:
ASP-DAC (2023)
Keyphrases
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wide range
integrated circuit
massively parallel
modeling method
individual level
semiconductor manufacturing
neural network
artificial intelligence
decision making
database systems
multi agent
higher level
modeling language
levels of abstraction