Wafer-level Variation Modeling for Multi-site RF IC Testing via Hierarchical Gaussian Process.
Michihiro ShintaniRiaz-ul-haque MianTomoki NakamuraMasuo KajiyamaMakoto EikiMichiko InouePublished in: CoRR (2021)
Keyphrases
- gaussian process
- multi site
- gaussian processes
- integrated circuit
- gaussian process models
- gaussian process regression
- bayesian framework
- geographically distributed
- regression model
- model selection
- hyperparameters
- approximate inference
- latent variables
- semi supervised
- expectation propagation
- prior knowledge
- data mining
- closed form
- denoising
- latent space
- pairwise
- data analysis
- machine learning