Wafer-level Variation Modeling for Multi-site RF IC Testing via Hierarchical Gaussian Process.
Michihiro ShintaniRiaz-ul-haque MianMichiko InoueTomoki NakamuraMasuo KajiyamaMakoto EikiPublished in: ITC (2021)
Keyphrases
- gaussian process
- multi site
- gaussian processes
- integrated circuit
- gaussian process models
- gaussian process regression
- model selection
- regression model
- bayesian framework
- approximate inference
- semi supervised
- hyperparameters
- latent variables
- sparse approximations
- geographically distributed
- expectation propagation
- incremental learning
- latent space
- cross validation
- prior knowledge
- support vector
- clustering algorithm