Man Ho Ling

Publication Activity (10 Years)

Years Active: 2012-2024
Publications (10 Years): 14

Top Topics

Expectation Maximisation

Weibull Distribution

Top Venues

IEEE Trans. Reliab.

Reliab. Eng. Syst. Saf.

Commun. Stat. Simul. Comput.

Qual. Reliab. Eng. Int.

Publications

Man Ho Ling, Suk Joo Bae
A random-effect gamma process model with random initial degradation for accelerated destructive degradation testing data. Qual. Reliab. Eng. Int. 40 (1) (2024)
Man Ho Ling, Narayanaswamy Balakrishnan, Suk Joo Bae
On the application of inverted Dirichlet distribution for reliability inference of completely censored components with dependence structure. Comput. Ind. Eng. 196 (2024)
Narayanaswamy Balakrishnan, Elena Castilla, Man Ho Ling
Optimal designs of constant-stress accelerated life-tests for one-shot devices with model misspecification analysis. Qual. Reliab. Eng. Int. 38 (2) (2022)
Chien-Tai Lin, Narayanaswamy Balakrishnan, Man Ho Ling
Exact tests for outliers in Laplace samples. Commun. Stat. Simul. Comput. 51 (10) (2022)
Chun Pang Lin, Man Ho Ling, Javier Cabrera, Fangfang Yang, Denis Yau Wai Yu, Kwok Leung Tsui
Prognostics for lithium-ion batteries using a two-phase gamma degradation process model. Reliab. Eng. Syst. Saf. 214 (2021)
Man Ho Ling, H. K. T. Ng, Kwok Leung Tsui
Bayesian and likelihood inferences on remaining useful life in two-phase degradation models under gamma process. Reliab. Eng. Syst. Saf. 184 (2019)
Xiaobei Shen, Zoie Shui-Yee Wong, Man Ho Ling, David Goldsman, Kwok-Leung Tsui
Comparison of algorithms to simulate disease transmission. J. Simulation 11 (3) (2017)
Leonard K. M. Poon, Siu-Cheung Kong, Thomas S. H. Yau, Michael Y. W. Wong, Man Ho Ling
Learning Analytics for Monitoring Students Participation Online: Visualizing Navigational Patterns on Learning Management System. ICBL (2017)
Man Ho Ling, Shui Yee Wong, Kwok-Leung Tsui
Efficient heterogeneous sampling for stochastic simulation with an illustration in health care applications. Commun. Stat. Simul. Comput. 46 (1) (2017)
Man Ho Ling, Narayanaswamy Balakrishnan
Model Mis-Specification Analyses of Weibull and Gamma Models Based on One-Shot Device Test Data. IEEE Trans. Reliab. 66 (3) (2017)
Man Ho Ling, Hon Keung Tony Ng, Ping Shing Chan, Narayanaswamy Balakrishnan
Autopsy Data Analysis for a Series System With Active Redundancy Under a Load-Sharing Model. IEEE Trans. Reliab. 65 (2) (2016)
Man Ho Ling, Hon Yiu So, Narayanaswamy Balakrishnan
Likelihood Inference Under Proportional Hazards Model for One-Shot Device Testing. IEEE Trans. Reliab. 65 (1) (2016)
Narayanaswamy Balakrishnan, Hon Yiu So, Man Ho Ling
EM Algorithm for One-Shot Device Testing With Competing Risks Under Weibull Distribution. IEEE Trans. Reliab. 65 (2) (2016)
Narayanaswamy Balakrishnan, Hon Yiu So, Man Ho Ling
A Bayesian Approach for One-Shot Device Testing With Exponential Lifetimes Under Competing Risks. IEEE Trans. Reliab. 65 (1) (2016)
Narayanaswamy Balakrishnan, Hon Yiu So, Man Ho Ling
EM algorithm for one-shot device testing with competing risks under exponential distribution. Reliab. Eng. Syst. Saf. 137 (2015)
Man Ho Ling, Kwok-Leung Tsui, Narayanaswamy Balakrishnan
Accelerated Degradation Analysis for the Quality of a System Based on the Gamma Process. IEEE Trans. Reliab. 64 (1) (2015)
Narayanaswamy Balakrishnan, Man Ho Ling
Best Constant-Stress Accelerated Life-Test Plans With Multiple Stress Factors for One-Shot Device Testing Under a Weibull Distribution. IEEE Trans. Reliab. 63 (4) (2014)
Narayanaswamy Balakrishnan, Man Ho Ling
Gamma lifetimes and one-shot device testing analysis. Reliab. Eng. Syst. Saf. 126 (2014)
Hui Yang, O. Erhun Kundakcioglu, Jing Li, Teresa Wu, Joseph Ross Mitchell, Amy K. Hara, William Pavlicek, Leland S. Hu, Alvin C. Silva, Christine M. Zwart, Sait Tunc, Oguzhan Alagöz, Elizabeth S. Burnside, W. Art Chaovalitwongse, Georgiy Presnyakov, Yulian Cao, Sirirat Sujitnapitsatham, Daehan Won, Tara M. Madhyastha, Kurt E. Weaver, Paul R. Borghesani, Thomas J. Grabowski, Lianjie Shu, Man Ho Ling, Shui Yee Wong, Kwok-Leung Tsui
Healthcare Intelligence: Turning Data into Knowledge. IEEE Intell. Syst. 29 (3) (2014)
Narayanaswamy Balakrishnan, Man Ho Ling
Expectation Maximization Algorithm for One Shot Device Accelerated Life Testing with Weibull Lifetimes, and Variable Parameters over Stress. IEEE Trans. Reliab. 62 (2) (2013)
Narayanaswamy Balakrishnan, Man Ho Ling
Multiple-Stress Model for One-Shot Device Testing Data Under Exponential Distribution. IEEE Trans. Reliab. 61 (3) (2012)
Narayanaswamy Balakrishnan, Man Ho Ling
EM algorithm for one-shot device testing under the exponential distribution. Comput. Stat. Data Anal. 56 (3) (2012)