Multiple-Stress Model for One-Shot Device Testing Data Under Exponential Distribution.
Narayanaswamy BalakrishnanMan Ho LingPublished in: IEEE Trans. Reliab. (2012)
Keyphrases
- experimental data
- test data
- data sets
- probability distribution
- input data
- data processing
- prior knowledge
- high level
- expert knowledge
- data distribution
- data sources
- data collection
- data structure
- computational model
- original data
- power law
- measurement data
- mathematical model
- training data
- knowledge discovery
- test cases
- database
- measured data
- data analysis
- empirical data
- gaussian distribution
- multiple viewpoints
- multiple models
- statistical tests
- xml documents
- data quality
- hidden markov models
- statistical methods
- network structure
- semi supervised
- em algorithm