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A Bayesian Approach for One-Shot Device Testing With Exponential Lifetimes Under Competing Risks.
Narayanaswamy Balakrishnan
Hon Yiu So
Man Ho Ling
Published in:
IEEE Trans. Reliab. (2016)
Keyphrases
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risk management
decision making
test cases
artificial intelligence
risk analysis
bayesian networks
artificial neural networks
decision support system
test set