Luis Carlos Méndez González

Publication Activity (10 Years)

Years Active: 2016-2023
Publications (10 Years): 13

Top Topics

Electronic Devices

Reliability Analysis

Regression Model

Top Venues

Qual. Reliab. Eng. Int.

J. Intell. Manuf.

Publications

Luis Carlos Méndez González, Luis Alberto Rodríguez-Picón, Iván Juan Carlos Pérez Olguín, Luis Ricardo Vidal Portilla
An Additive Chen Distribution with Applications to Lifetime Data. Axioms 12 (2) (2023)
Luis Alberto Rodríguez-Picón, Luis Carlos Méndez González, Iván Juan Carlos Pérez Olguín, Jesús Israel Hernández Hernández
A Gamma Process with Three Sources of Variability. Symmetry 15 (1) (2023)
Luis Carlos Méndez González, Luis Alberto Rodríguez-Picón, Iván Juan Carlos Pérez Olguín, Vicente García, Abel Eduardo Quezada-Carreón
A reliability analysis for electronic devices under an extension of exponentiated perks distribution. Qual. Reliab. Eng. Int. 39 (3) (2023)
Florencio Abraham Roldán-Castellanos, Iván Juan Carlos Pérez Olguín, Aimeé Gutiérrez-Vázquez, Luis Carlos Méndez González, Luis Alberto Rodríguez-Picón
Emotional Classification Method (ECW): A Methodology for Measuring Emotional Sustainability in a Work Environment Utilizing Artificial Intelligence. Axioms 12 (2) (2023)
Paulo Eduardo García-Nava, Luis Alberto Rodríguez-Picón, Luis Carlos Méndez González, Iván Juan Carlos Pérez Olguín
A Study of Stopping Rules in the Steepest Ascent Methodology for the Optimization of a Simulated Process. Axioms 11 (10) (2022)
Vicente García, J. Salvador Sánchez, Rafael Martínez-Peláez, Luis Carlos Méndez González
Revisiting the Dissimilarity Representation in the Context of Regression. IEEE Access 9 (2021)
Vicente García, J. Salvador Sánchez, Luis Alberto Rodríguez-Picón, Luis Carlos Méndez González, Humberto de Jesús Ochoa Domínguez
Using regression models for predicting the product quality in a tubing extrusion process. J. Intell. Manuf. 30 (6) (2019)
Luis Carlos Méndez González, Luis Alberto Rodríguez-Picón, Delia J. Valles-Rosales, Alejandro Alvarado-Iniesta, Abel Eduardo Quezada-Carreón
Reliability analysis using exponentiated Weibull distribution and inverse power law. Qual. Reliab. Eng. Int. 35 (4) (2019)
Luis Alberto Rodríguez-Picón, Anna Patricia Rodríguez-Picón, Luis Carlos Méndez González, Manuel Iván Rodríguez-Borbón, Alejandro Alvarado-Iniesta
Degradation modeling based on gamma process models with random effects. Commun. Stat. Simul. Comput. 47 (6) (2018)
Luis Carlos Méndez González, Luis Alberto Rodríguez-Picón, Delia J. Valles-Rosales, Roberto Romero-López, Abel Eduardo Quezada-Carreón
Reliability analysis for electronic devices using beta-Weibull distribution. Qual. Reliab. Eng. Int. 33 (8) (2017)
Luis Alberto Rodríguez-Picón, Luis Carlos Méndez González, Manuel Iván Rodríguez-Borbón, Arturo Del Valle
Reliability Estimation for Products Subjected to Two-Stage Degradation Tests Based on a Gamma Convolution. Qual. Reliab. Eng. Int. 32 (8) (2016)
Luis Carlos Méndez González, Manuel Iván Rodríguez-Borbón, Manuel R. Piña-Monarrez, Roberto Ambrosio, Arturo Del Valle
Reliability Analysis for Laptop Computer Under Electrical Harmonics. Qual. Reliab. Eng. Int. 32 (8) (2016)
Luis Carlos Méndez González, Manuel Iván Rodríguez-Borbón, Delia J. Valles-Rosales, Arturo Del Valle, Arnoldo Rodriguez
Reliability Model for Electronic Devices under Time Varying Voltage. Qual. Reliab. Eng. Int. 32 (4) (2016)