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Degradation modeling based on gamma process models with random effects.

Luis Alberto Rodríguez-PicónAnna Patricia Rodríguez-PicónLuis Carlos Méndez GonzálezManuel Iván Rodríguez-BorbónAlejandro Alvarado-Iniesta
Published in: Commun. Stat. Simul. Comput. (2018)
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