Manuel Iván Rodríguez-Borbón

Publication Activity (10 Years)

Years Active: 2013-2020
Publications (10 Years): 9

Top Topics

Manufacturing Industry

Measurement Error

Desirability Function

Top Venues

Qual. Reliab. Eng. Int.

Res. Comput. Sci.

Commun. Stat. Simul. Comput.

Publications

Marina De La Vega, Yolanda A. Báez-López, Jorge Limon-Romero, Diego A. Tlapa, Dora-Luz Flores, Manuel Iván Rodríguez-Borbón, Aidé Aracely Maldonado-Macías
Lean Manufacturing Critical Success Factors for the Transportation Equipment Manufacturing Industry in Mexico. IEEE Access 8 (2020)
Luis Alberto Rodríguez-Picón, Luis Asunción Pérez Dominguez, José Mejía, Iván Jc Pérez-Olguín, Manuel Iván Rodríguez-Borbón
A Deconvolution Approach for Degradation Modeling With Measurement Error. IEEE Access 7 (2019)
Luis Alberto Rodríguez-Picón, Anna Patricia Rodríguez-Picón, Luis Carlos Méndez González, Manuel Iván Rodríguez-Borbón, Alejandro Alvarado-Iniesta
Degradation modeling based on gamma process models with random effects. Commun. Stat. Simul. Comput. 47 (6) (2018)
Manuel Iván Rodríguez-Borbón, Manuel Arnoldo Rodríguez-Medina, Luis Alberto Rodríguez-Picón, Alejandro Alvarado-Iniesta, Naijun Sha
Reliability Estimation for Accelerated Life Tests Based on a Cox Proportional Hazard Model with Error Effect. Qual. Reliab. Eng. Int. 33 (7) (2017)
Jorge Limon-Romero, Yolanda A. Báez, Diego A. Tlapa, Mitzy Pory-Lugo, Manuel Iván Rodríguez-Borbón
Optimization of Multiple Response Variables Using the Desirability Function and a Bayesian Predictive Distribution. Res. Comput. Sci. 132 (2017)
Luis Alberto Rodríguez-Picón, Luis Carlos Méndez González, Manuel Iván Rodríguez-Borbón, Arturo Del Valle
Reliability Estimation for Products Subjected to Two-Stage Degradation Tests Based on a Gamma Convolution. Qual. Reliab. Eng. Int. 32 (8) (2016)
Luis Carlos Méndez González, Manuel Iván Rodríguez-Borbón, Manuel R. Piña-Monarrez, Roberto Ambrosio, Arturo Del Valle
Reliability Analysis for Laptop Computer Under Electrical Harmonics. Qual. Reliab. Eng. Int. 32 (8) (2016)
Luis Carlos Méndez González, Manuel Iván Rodríguez-Borbón, Delia J. Valles-Rosales, Arturo Del Valle, Arnoldo Rodriguez
Reliability Model for Electronic Devices under Time Varying Voltage. Qual. Reliab. Eng. Int. 32 (4) (2016)
Manuel R. Piña-Monarrez, Jesús F. Ortiz-Yañez, Manuel Iván Rodríguez-Borbón
Non-normal Capability Indices for the Weibull and Lognormal Distributions. Qual. Reliab. Eng. Int. 32 (4) (2016)
Alejandro Alvarado-Iniesta, Jorge Luis García-Alcaraz, Manuel Iván Rodríguez-Borbón, Aidé Maldonado
Optimization of the material flow in a manufacturing plant by use of artificial bee colony algorithm. Expert Syst. Appl. 40 (12) (2013)