Reliability Model for Electronic Devices under Time Varying Voltage.
Luis Carlos Méndez GonzálezManuel Iván Rodríguez-BorbónDelia J. Valles-RosalesArturo Del ValleArnoldo RodriguezPublished in: Qual. Reliab. Eng. Int. (2016)
Keyphrases
- theoretical framework
- electronic devices
- probability distribution
- data sets
- parameter estimation
- formal model
- experimental data
- computational model
- theoretical analysis
- probabilistic model
- information retrieval
- cost function
- mathematical model
- statistical model
- artificial neural networks
- simulation model
- knowledge base