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Reliability analysis for electronic devices using beta-Weibull distribution.
Luis Carlos Méndez González
Luis Alberto Rodríguez-Picón
Delia J. Valles-Rosales
Roberto Romero-López
Abel Eduardo Quezada-Carreón
Published in:
Qual. Reliab. Eng. Int. (2017)
Keyphrases
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reliability analysis
electronic devices
weibull distribution
image intensity
smart phones
probability density function
image segmentation
design methodology
neural network
bayesian networks
probability distribution
energy function