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Kuan-Hsien Li
Publication Activity (10 Years)
Years Active: 2012-2017
Publications (10 Years): 1
Top Topics
Image Processing
Leak Detection
Error Rate
Online Environment
Top Venues
J. Electron. Test.
Microelectron. J.
VLSI-DAT
APNOMS
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Publications
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Tong-Yu Hsieh
,
Kuan-Hsien Li
,
Chen-Chia Chung
A fault-analysis oriented re-design and cost-effectiveness evaluation methodology for error tolerant applications.
Microelectron. J.
66 (2017)
Tong-Yu Hsieh
,
Yi-Han Peng
,
Kuan-Hsien Li
Efficient Error-Tolerability Testing on Image Processing Circuits Based on Equivalent Error Rate Transformation.
J. Electron. Test.
30 (6) (2014)
Tong-Yu Hsieh
,
Kuan-Hsien Li
,
Yi-Han Peng
On efficient error-tolerability evaluation and maximization for image processing applications.
VLSI-DAT
(2014)
Jui-Shan Liang
,
Hung-Wei Kao
,
Han-Ching Tsao
,
Shao-Chen Chang
,
Meng-Hsun Tsai
,
Kuan-Hsien Li
,
Yingrong Coral Sung
Two-phase online memory leak detection.
APNOMS
(2012)