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Efficient Error-Tolerability Testing on Image Processing Circuits Based on Equivalent Error Rate Transformation.

Tong-Yu HsiehYi-Han PengKuan-Hsien Li
Published in: J. Electron. Test. (2014)
Keyphrases
  • error rate
  • image processing
  • test set
  • rule sets
  • machine vision
  • training error
  • lower error rates
  • false discovery rate
  • feature extraction
  • word error rate
  • expected loss
  • correct recognition rate