Jushan Xie

Publication Activity (10 Years)

Years Active: 2017-2019
Publications (10 Years): 2

Top Topics

Statistical Model

Prior Knowledge

Top Venues

Publications

Art Schaldenbrand, Jushan Xie, Hany Elhak
Recent Updates to Transistor Level Reliability Analysis. IRPS (2019)
Shaofeng Guo, Runsheng Wang, Zhuoqing Yu, Peng Hao, Pengpeng Ren, Yangyuan Wang, Siyu Liao, Chunyi Huang, Tianlei Guo, Alvin Chen, Jushan Xie, Ru Huang
Towards reliability-aware circuit design in nanoscale FinFET technology: - New-generation aging model and circuit reliability simulator. ICCAD (2017)