Towards reliability-aware circuit design in nanoscale FinFET technology: - New-generation aging model and circuit reliability simulator.
Shaofeng GuoRunsheng WangZhuoqing YuPeng HaoPengpeng RenYangyuan WangSiyu LiaoChunyi HuangTianlei GuoAlvin ChenJushan XieRu HuangPublished in: ICCAD (2017)