Joris Roels

Publication Activity (10 Years)

Years Active: 2014-2022
Publications (10 Years): 13

Top Topics

Active Learning

Electron Microscopy

Image Segmentation

Top Venues

BNAIC/BENELEARN

Publications

Benjamin Rombaut, Joris Roels, Yvan Saeys
BioSegment: Active Learning segmentation for 3D electron microscopy imaging. IAL@PKDD/ECML (2022)
Xiaoning Jia, Joris Roels, Roel Baets, Gunther Roelkens
A Miniaturised, Fully Integrated NDIR CO2 Sensor On-Chip. Sensors 21 (16) (2021)
Joris Roels, Julian Hennies, Yvan Saeys, Wilfried Philips, Anna Kreshuk
Domain Adaptive Segmentation In Volume Electron Microscopy Imaging. ISBI (2019)
Xiaoning Jia, Joris Roels, Roel Baets, Gunther Roelkens
On-Chip Non-Dispersive Infrared CO2 Sensor Based On an Integrating Cylinder. Sensors 19 (19) (2019)
Joris Roels, Yvan Saeys
Cost-efficient segmentation of electron microscopy images using active learning. CoRR (2019)
Joris Roels, Yvan Saeys
Cost-Efficient Segmentation of Electron Microscopy Images Using Active Learning. BNAIC/BENELEARN (2019)
Joris Roels, Jonas De Vylder, Jan Aelterman, Yvan Saeys, Wilfried Philips
Convolutional Neural Network Pruning to Accelerate Membrane Segmentation in Electron Microscopy. CoRR (2018)
Joris Roels, Julian Hennies, Yvan Saeys, Wilfried Philips, Anna Kreshuk
Domain Adaptive Segmentation in Volume Electron Microscopy Imaging. CoRR (2018)
Joris Roels, Jan Aelterman, Jonas De Vylder, Hiêp Quang Luong, Yvan Saeys, Wilfried Philips
Bayesian Deconvolution of Scanning Electron Microscopy Images Using Point-spread Function Estimation and Non-local Regularization. CoRR (2018)
Joris Roels, Jonas De Vylder, Jan Aelterman, Yvan Saeys, Wilfried Philips
Convolutional neural network pruning to accelerate membrane segmentation in electron microscopy. ISBI (2017)
Jonathan Peck, Joris Roels, Bart Goossens, Yvan Saeys
Lower bounds on the robustness to adversarial perturbations. NIPS (2017)
Joris Roels, Jan Aelterman, Jonas De Vylder, Hiêp Quang Luong, Yvan Saeys, Wilfried Philips
Bayesian deconvolution of scanning electron microscopy images using point-spread function estimation and non-local regularization. EMBC (2016)
Joris Roels, Jonas De Vylder, Yvan Saeys, Bart Goossens, Wilfried Philips
Decreasing Time Consumption of Microscopy Image Segmentation Through Parallel Processing on the GPU. ACIVS (2016)
Joris Roels, Jan Aelterman, Jonas De Vylder, Hiêp Quang Luong, Yvan Saeys, Saskia Lippens, Wilfried Philips
Noise Analysis and Removal in 3D Electron Microscopy. ISVC (1) (2014)