Bayesian deconvolution of scanning electron microscopy images using point-spread function estimation and non-local regularization.
Joris RoelsJan AeltermanJonas De VylderHiêp Quang LuongYvan SaeysWilfried PhilipsPublished in: EMBC (2016)
Keyphrases
- point spread function
- generalized cross validation
- microscopy images
- blind deconvolution
- image restoration
- regularization parameter
- electron microscopy
- blurred images
- motion blur
- blur identification
- wiener filter
- motion blurred image
- additive noise
- multiple images
- linear combination
- image deconvolution
- blind image deconvolution
- transfer function
- image prior
- multi channel
- bayesian estimation
- motion deblurring
- x ray
- maximum likelihood
- map estimation
- total variation
- alternating minimization
- cross validation
- image deblurring
- regularization term
- synthetic and real images
- super resolution
- blur kernel
- spatial domain
- single image
- motion estimation
- dynamic scenes
- image quality
- input image