TOTAL VARIATION
Experts
- Aggelos K. Katsaggelos
- Wangmeng Zuo
- Michael K. Ng
- Ting-Zhu Huang
- Rafael Molina
- Lei Zhang
- Michael Elad
- Xi-Le Zhao
- Karen O. Egiazarian
- Deyu Meng
- Jean-Christophe Pesquet
- Liangpei Zhang
- Stanley J. Osher
- Peyman Milanfar
- Yulun Zhang
- José M. Bioucas-Dias
- Michael Unser
- Tieyong Zeng
- Ivan W. Selesnick
- Radu Timofte
- Mário A. T. Figueiredo
- Ming-Hsuan Yang
- Wen Gao
- Yanning Zhang
- Stephen P. Boyd
- Thomas Pock
- Tony F. Chan
- Bihan Wen
- Luc Van Gool
- Zhiyuan Zha
- David Zhang
- Shunsuke Ono
- Yonina C. Eldar
- Thomas S. Huang
- Zhouchen Lin
- Jocelyn Chanussot
- Gene Cheung
- Wotao Yin
- Wei He
Venues
- CoRR
- ICASSP
- ICIP
- IEEE Trans. Image Process.
- IEEE Access
- EUSIPCO
- Signal Process.
- IEEE Trans. Geosci. Remote. Sens.
- CVPR
- IEEE Trans. Signal Process.
- IEEE Signal Process. Lett.
- Multim. Tools Appl.
- CDC
- IGARSS
- SIAM J. Imaging Sci.
- Sensors
- ISBI
- Appl. Math. Comput.
- Neurocomputing
- NeurIPS
- ICML
- J. Electronic Imaging
- Signal Image Video Process.
- IEEE Geosci. Remote. Sens. Lett.
- Math. Program.
- ICCV
- IET Image Process.
- J. Vis. Commun. Image Represent.
- J. Math. Imaging Vis.
- J. Comput. Appl. Math.
- ACC
- IEEE Trans. Autom. Control.
- SIAM J. Optim.
- Remote. Sens.
- J. Sci. Comput.
- NIPS
- ICIP (1)
- J. Optim. Theory Appl.
- Comput. Optim. Appl.
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