Bayesian Deconvolution of Scanning Electron Microscopy Images Using Point-spread Function Estimation and Non-local Regularization.
Joris RoelsJan AeltermanJonas De VylderHiêp Quang LuongYvan SaeysWilfried PhilipsPublished in: CoRR (2018)
Keyphrases
- point spread function
- generalized cross validation
- microscopy images
- blind deconvolution
- image restoration
- electron microscopy
- regularization parameter
- blur identification
- blurred images
- wiener filter
- motion blur
- motion blurred image
- image deconvolution
- image prior
- map estimation
- multiple images
- additive noise
- bayesian estimation
- blind image deconvolution
- alternating minimization
- multi channel
- motion deblurring
- linear combination
- transfer function
- x ray
- image deblurring
- image processing
- maximum likelihood
- synthetic and real images
- total variation
- thin film
- blur kernel
- bayesian inference
- prior information
- segmentation algorithm
- super resolution
- optical flow
- image segmentation