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Noise Analysis and Removal in 3D Electron Microscopy.
Joris Roels
Jan Aelterman
Jonas De Vylder
Hiêp Quang Luong
Yvan Saeys
Saskia Lippens
Wilfried Philips
Published in:
ISVC (1) (2014)
Keyphrases
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electron microscopy
data analysis
fine grained
noise level