Joachim Glück

Publication Activity (10 Years)

Years Active: 2014-2016
Publications (10 Years): 1

Top Topics

High Temperature

Quantitative Analysis

Top Venues

Microelectron. Reliab.

Universität Stuttgart (PHD)

Education History

Universität Stuttgart

PHD

Publications

Clemens Helfmeier, Erik Frieß, Joachim Glück
Static logic state analysis by TLS on powered logic circuits: Three case studies for suspected stuck-at failure modes. Microelectron. Reliab. 64 (2016)
Jörg C. Krinke, Dragica Dragicevic, Susann Leinert, Erik Frieß, Joachim Glück
High temperature degradation of palladium coated copper bond wires. Microelectron. Reliab. 54 (9-10) (2014)