Jaewoong Shim

Publication Activity (10 Years)

Years Active: 2017-2024
Publications (10 Years): 8

Top Topics

Pattern Classification

Active Learning

Semiconductor Manufacturing

Process Control

Top Venues

Comput. Ind. Eng.

Expert Syst. Appl.

Int. J. Prod. Res.

Publications

Han Kyul Kim, Jaewoong Shim
Generalized zero-shot learning for classifying unseen wafer map patterns. Eng. Appl. Artif. Intell. 133 (2024)
Jaewoong Shim, Seokho Kang
Learning from single-defect wafer maps to classify mixed-defect wafer maps. Expert Syst. Appl. 233 (2023)
Jaewoong Shim, Seokho Kang
Domain-adaptive active learning for cost-effective virtual metrology modeling. Comput. Ind. 135 (2022)
Jaewoong Shim, Seokho Kang, Sungzoon Cho
Active cluster annotation for wafer map pattern classification in semiconductor manufacturing. Expert Syst. Appl. 183 (2021)
Jaewoong Shim, Sungzoon Cho, Euiseok Kum, Suho Jeong
Adaptive fault detection framework for recipe transition in semiconductor manufacturing. Comput. Ind. Eng. 161 (2021)
Jaewoong Shim, Seokho Kang, Sungzoon Cho
Kernel Rotation Forests for Classification. BigComp (2020)
Seokho Kang, Eunji Kim, Jaewoong Shim, Wonsang Chang, Sungzoon Cho
Product failure prediction with missing data. Int. J. Prod. Res. 56 (14) (2018)
Seokho Kang, Eunji Kim, Jaewoong Shim, Sungzoon Cho, Wonsang Chang, Junhwan Kim
Mining the relationship between production and customer service data for failure analysis of industrial products. Comput. Ind. Eng. 106 (2017)