Learning from single-defect wafer maps to classify mixed-defect wafer maps.
Jaewoong ShimSeokho KangPublished in: Expert Syst. Appl. (2023)
Keyphrases
- learning algorithm
- learning systems
- learning process
- information retrieval
- semiconductor manufacturing
- mobile learning
- unsupervised learning
- online learning
- expert systems
- control system
- feature extraction
- knowledge acquisition
- website
- information systems
- social networks
- learning tasks
- learning community
- autonomous robots
- neural network