J. W. McPherson

Publication Activity (10 Years)

Years Active: 2001-2023
Publications (10 Years): 3

Top Topics

Genetic Algorithm

Friendly Interface

Failure Detection

Widespread Adoption

Top Venues

Publications

Edward Van Brunt, Daniel J. Lichtenwalner, J. H. Park, Satyaki Ganguly, J. W. McPherson
Lifetime Modeling of the 4H-SiC MOS Interface in the HTRB Condition Under the Influence of Screw Dislocations. IRPS (2023)
Evelyn Landman, Shai Cohen, Noam Brousard, Raanan Gewirtzman, Inbar Weintrob, Eyal Fayne, Yahel David, Yuval Bonen, Omer Niv, Shai Tzroia, Alex Burlak, J. W. McPherson
Degradation Monitoring - from a Vision to Reality. IRPS (2019)
J. W. McPherson
Brief history of JEDEC qualification standards for silicon technology and their applicability(?) to WBG semiconductors. IRPS (2018)
J. W. McPherson
Understanding the underlying degradation physics for proper time-to-failure distribution selection. IRPS (2015)
J. W. McPherson
Time dependent dielectric breakdown physics - Models revisited. Microelectron. Reliab. 52 (9-10) (2012)
J. W. McPherson
Reliability Trends with Advanced CMOS Scaling and The Implications for Design. CICC (2007)
J. W. McPherson
Reliability challenges for 45nm and beyond. DAC (2006)
J. W. McPherson
Mie-Grüneisen Analysis of the Molecular Bonding States in Silica Which Impact Time-Dependent Dielectric Breakdown. Microelectron. Reliab. 44 (9-11) (2004)
J. W. McPherson
Scaling-Induced Reductions in CMOS Reliability Margins and the Escalating Need for Increased Design-In Reliability Efforts. ISQED (2001)