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Lifetime Modeling of the 4H-SiC MOS Interface in the HTRB Condition Under the Influence of Screw Dislocations.

Edward Van BruntDaniel J. LichtenwalnerJ. H. ParkSatyaki GangulyJ. W. McPherson
Published in: IRPS (2023)
Keyphrases
  • visual interface
  • artificial intelligence
  • modeling framework
  • knowledge base
  • user interface
  • factors influencing
  • neural network
  • decision trees
  • case study
  • friendly interface