Islam A. K. M. Mahfuzul

Publication Activity (10 Years)

Years Active: 2012-2018
Publications (10 Years): 6

Top Topics

Air Conditioning

Thresholding Algorithm

Thermal Imaging

Top Venues

IEICE Trans. Inf. Syst.

IEEE J. Emerg. Sel. Topics Circuits Syst.

Publications

Teruki Someya, Islam A. K. M. Mahfuzul, Takayasu Sakurai, Makoto Takamiya
A 13nW temperature-to-digital converter utilizing sub-threshold MOSFET operation at sub-thermal drain voltage. CICC (2018)
Islam A. K. M. Mahfuzul, Masamune Hamamatsu, Tomoyuki Yokota, Sunghoon Lee, Wakako Yukita, Makoto Takamiya, Takao Someya, Takayasu Sakurai
Programmable Neuron Array Based on a 2-Transistor Multiplier Using Organic Floating-Gate for Intelligent Sensors. IEEE J. Emerg. Sel. Topics Circuits Syst. 7 (1) (2017)
Islam A. K. M. Mahfuzul, Hidetoshi Onodera
Effect of supply voltage on random telegraph noise of transistors under switching condition. PATMOS (2017)
Islam A. K. M. Mahfuzul, Hidetoshi Onodera
On-chip monitoring and compensation scheme with fine-grain body biasing for robust and energy-efficient operations. ASP-DAC (2016)
Islam A. K. M. Mahfuzul, Jun Shiomi, Tohru Ishihara, Hidetoshi Onodera
Wide-Supply-Range All-Digital Leakage Variation Sensor for On-Chip Process and Temperature Monitoring. IEEE J. Solid State Circuits 50 (11) (2015)
Norihiro Kamae, Islam A. K. M. Mahfuzul, Akira Tsuchiya, Tohru Ishihara, Hidetoshi Onodera
Energy reduction by built-in body biasing with single supply voltage operation. ISQED (2015)
Norihiro Kamae, Islam A. K. M. Mahfuzul, Akira Tsuchiya, Hidetoshi Onodera
A body bias generator with wide supply-range down to threshold voltage for within-die variability compensation. A-SSCC (2014)
Islam A. K. M. Mahfuzul, Jun Shiomi, Tohru Ishihara, Hidetoshi Onodera
Wide-supply-range all-digital leakage variation sensor for on-chip process and temperature monitoring. A-SSCC (2014)
Islam A. K. M. Mahfuzul, Hidetoshi Onodera
Characterization and compensation of performance variability using on-chip monitors. VLSI-DAT (2014)
Islam A. K. M. Mahfuzul, Hidetoshi Onodera
On-Chip Detection of Process Shift and Process Spread for Post-Silicon Diagnosis and Model-Hardware Correlation. IEICE Trans. Inf. Syst. (9) (2013)
Islam A. K. M. Mahfuzul, Hidetoshi Onodera
On-Chip Detection of Process Shift and Process Spread for Silicon Debugging and Model-Hardware Correlation. Asian Test Symposium (2012)