Sign in
On-Chip Detection of Process Shift and Process Spread for Post-Silicon Diagnosis and Model-Hardware Correlation.
Islam A. K. M. Mahfuzul
Hidetoshi Onodera
Published in:
IEICE Trans. Inf. Syst. (2013)
Keyphrases
</>
low cost
process model
high density
real time
neural network
expert systems
probability distribution
mathematical model
object detection
recognition process