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On-Chip Detection of Process Shift and Process Spread for Silicon Debugging and Model-Hardware Correlation.

Islam A. K. M. MahfuzulHidetoshi Onodera
Published in: Asian Test Symposium (2012)
Keyphrases
  • process model
  • high level
  • recognition process
  • probabilistic model
  • neural network
  • similarity measure
  • detection algorithm
  • design process
  • mathematical model
  • steady state
  • optimization process