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On-Chip Detection of Process Shift and Process Spread for Silicon Debugging and Model-Hardware Correlation.
Islam A. K. M. Mahfuzul
Hidetoshi Onodera
Published in:
Asian Test Symposium (2012)
Keyphrases
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process model
high level
recognition process
probabilistic model
neural network
similarity measure
detection algorithm
design process
mathematical model
steady state
optimization process