Iftekhar Ibne Basith

Publication Activity (10 Years)

Years Active: 2010-2024
Publications (10 Years): 5

Top Topics

Comparative Study

Top Venues

IEEE Trans. Instrum. Meas.

Microelectron. J.

Publications

Syed Hasib Akhter Faruqui, Nazia Tasnim, Iftekhar Ibne Basith, Suleiman Obeidat, Faruk Yildiz
Integrating A.I. in Higher Education: Protocol for a Pilot Study with 'SAMCares: An Adaptive Learning Hub'. CoRR (2024)
Iftekhar Ibne Basith, Syed Hasib Akhter Faruqui, Vajih Khan, Suleiman Obeidat, Sumith Yesudasan
WIP: STEM Course Enhancement - Animated Safety Modules for Freshman Circuit Class. FIE (2023)
Iftekhar Ibne Basith, Esrafil Jedari, Rashid Rashidzadeh
A contactless probe utilizing inductive coupling. Microelectron. J. 63 (2017)
Iftekhar Ibne Basith, Rashid Rashidzadeh
Contactless Test Access Mechanism for TSV-Based 3-D ICs Utilizing Capacitive Coupling. IEEE Trans. Instrum. Meas. 65 (1) (2016)
Iftekhar Ibne Basith, Tareq Muhammad Supon, Esam Abdel-Raheem, Rashid Rashidzadeh
Comparative study on bus-coding schemes and improvement on SINV coding. ICM (2016)
Mohammed Alamgir, Iftekhar Ibne Basith, Tareq Muhammad Supon, Rashid Rashidzadeh
Improved bus-shift coding for low-power I/O. ISCAS (2015)
Iftekhar Ibne Basith, Rashid Rashidzadeh, Esam Abdel-Raheem
Contactless detection of faulty TSV in 3D IC via capacitive coupling. MWSCAS (2015)
Rashid Rashidzadeh, Iftekhar Ibne Basith
A test probe for TSV using resonant inductive coupling. ITC (2014)
Nabeeh Kandalaft, Iftekhar Ibne Basith, Rashid Rashidzadeh
Low-Contact Resistance Probe Card Using MEMS Technology. IEEE Trans. Instrum. Meas. 63 (12) (2014)
Iftekhar Ibne Basith, Nabeeh Kandalaft, Rashid Rashidzadeh, Majid Ahmadi
Charge-Controlled Readout and BIST Circuit for MEMS Sensors. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 32 (3) (2013)
Iftekhar Ibne Basith, Tareq Muhammad Supon, Ajit Muhury, Rashid Rashidzadeh, Majid Ahmadi
Performance enhancement of single electron junction 1-bit full adder. ICECS (2011)
Iftekhar Ibne Basith, Nabeeh Kandalaft, Rashid Rashidzadeh
Built-In Self-Test for Capacitive MEMS Using a Charge Control Technique. Asian Test Symposium (2010)
Nabeeh Kandalaft, Iftekhar Ibne Basith, Rashid Rashidzadeh
A MEMS based device interface board. ITC (2010)