Built-In Self-Test for Capacitive MEMS Using a Charge Control Technique.

Iftekhar Ibne Basith Nabeeh Kandalaft Rashid Rashidzadeh

Published in: Asian Test Symposium (2010)

Keyphrases

control system
control problems
genetic algorithm
website
process control
control theory
databases
computer vision
case study
multiscale
wide range
video sequences
information technology
artificial neural networks
optimal control
integrated circuit