Login / Signup
Contactless Test Access Mechanism for TSV-Based 3-D ICs Utilizing Capacitive Coupling.
Iftekhar Ibne Basith
Rashid Rashidzadeh
Published in:
IEEE Trans. Instrum. Meas. (2016)
Keyphrases
</>
smart card
search engine
multiresolution
access control
random access
artificial intelligence
image processing
computational model
statistical tests
data mining
training data
search algorithm
test cases
test data
information access
selection mechanism