Haldun Haznedar

Publication Activity (10 Years)

Years Active: 1998-2006
Publications (10 Years): 0

Publications

Haldun Haznedar, Martin Gall, Vladimir Zolotov, Pon Sung Ku, Chanhee Oh, Rajendran Panda
Impact of stress-induced backflow on full-chip electromigration risk assessment. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 25 (6) (2006)
Chanhee Oh, Haldun Haznedar, Martin Gall, Amir Grinshpon, Vladimir Zolotov, Pon Sung Ku, Rajendran Panda
A Methodology for Chip-Level Electromigration Risk Assessment and Product Qualification. ISQED (2004)
N. S. Nagaraj, Frank Cano, Haldun Haznedar, Duane Young
A Practical Approach to Static Signal Electromigration Analysis. DAC (1998)