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Impact of stress-induced backflow on full-chip electromigration risk assessment.
Haldun Haznedar
Martin Gall
Vladimir Zolotov
Pon Sung Ku
Chanhee Oh
Rajendran Panda
Published in:
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2006)
Keyphrases
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risk assessment
economic impact
risk management
risk factors
network security
risk analysis
decision making
low cost
information security
power plant
emergency management
evidence theory
data analysis
object oriented
computational intelligence
power consumption