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Haitham Eissa
Publication Activity (10 Years)
Years Active: 2010-2013
Publications (10 Years): 0
Top Topics
Chip Design
Design Methodologies
Hw Sw
Automated Analysis
Top Venues
ICECS
ISQED
IEEE Trans. Very Large Scale Integr. Syst.
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Publications
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Haitham Eissa
,
Rami Fathy Salem
,
Ahmed Arafa
,
Sherif Hany
,
Abdelrahman ElMously
,
Mohamed Dessouky
,
David Nairn
,
Mohab H. Anis
Parametric DFM Solution for Analog Circuits: Electrical-Driven Hotspot Detection, Analysis, and Correction Flow.
IEEE Trans. Very Large Scale Integr. Syst.
21 (5) (2013)
Rami F. Salem
,
Mohamed Al-Imam
,
Abdelrahman ElMously
,
Haitham Eissa
,
Ahmed Arafa
,
Mohab H. Anis
High performance electrical driven hotspot detection solution for full chip design using a novel device parameter matching technique.
ISQED
(2012)
Ahmed Zein
,
Amr Tarek
,
Mohamed Bahr
,
Mohamed Dessouky
,
Haitham Eissa
,
Ahmed Ramadan
,
Amr Tosson
Layout stress and proximity aware analog design methodology.
ICECS
(2012)
Rami Fathy Salem
,
Ahmed Arafa
,
Sherif Hany
,
Abdelrahman ElMously
,
Haitham Eissa
,
Mohamed Dessouky
,
David Nairn
,
Mohab H. Anis
An electrical-aware parametric DFM solution for analog circuits.
IDT
(2011)
Rami F. Salem
,
Ahmed Arafa
,
Sherif Hany
,
Abdelrahman ElMously
,
Haitham Eissa
,
Mohamed Dessouky
,
David Nairn
,
Mohab H. Anis
A parametric DFM solution for analog circuits: Electrical driven hot spot detection, analysis and correction flow.
SoCC
(2011)
Romany Sameer
,
Ahmed Nader Mohieldin
,
Haitham Eissa
An automated design methodology for stress avoidance in analog & mixed signal designs.
IDT
(2010)
Rami F. Salem
,
Abdelrahman ElMously
,
Haitham Eissa
,
Mohamed Dessouky
,
Mohab H. Anis
A DFM tool for analyzing lithography and stress effects on standard cells and critical path performance in 45nm digital designs.
IDT
(2010)