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Parametric DFM Solution for Analog Circuits: Electrical-Driven Hotspot Detection, Analysis, and Correction Flow.

Haitham EissaRami Fathy SalemAhmed ArafaSherif HanyAbdelrahman ElMouslyMohamed DessoukyDavid NairnMohab H. Anis
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2013)
Keyphrases
  • analog circuits
  • automatic analysis
  • automated analysis
  • automatic detection
  • decision making
  • search space
  • fuzzy logic
  • detection rate