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A parametric DFM solution for analog circuits: Electrical driven hot spot detection, analysis and correction flow.

Rami F. SalemAhmed ArafaSherif HanyAbdelrahman ElMouslyHaitham EissaMohamed DessoukyDavid NairnMohab H. Anis
Published in: SoCC (2011)
Keyphrases
  • hot spots
  • analog circuits
  • data analysis
  • real time
  • statistical analysis
  • neural network
  • artificial intelligence
  • knowledge discovery
  • social network analysis