Evgeni P. Gusev

Publication Activity (10 Years)

Years Active: 1999-2006
Publications (10 Years): 0

Publications

Huiling Shang, Martin M. Frank, Evgeni P. Gusev, Jack O. Chu, Stephen W. Bedell, Kathryn W. Guarini, Mei-Kei Ieong
Germanium channel MOSFETs: Opportunities and challenges. IBM J. Res. Dev. 50 (4-5) (2006)
Evgeni P. Gusev, Vijay Narayanan, Martin M. Frank
Advanced high-k dielectric stacks with polySi and metal gates: Recent progress and current challenges. IBM J. Res. Dev. 50 (4-5) (2006)
J.-P. Han, S. M. Koo, E. M. Vogel, Evgeni P. Gusev, C. D'Emic, C. A. Richter, J. S. Suehle
Reverse short channel effects in high-k gated nMOSFETs. Microelectron. Reliab. 45 (5-6) (2005)
J. A. Felix, J. R. Schwank, Daniel M. Fleetwood, M. R. Shaneyfelt, Evgeni P. Gusev
Effects of radiation and charge trapping on the reliability of high-kappa gate dielectrics. Microelectron. Reliab. 44 (4) (2004)
Evgeni P. Gusev, Hsu-Chang Lu, Eric L. Garfunkel, Torgny Gustafsson, Martin L. Green
Growth and characterization of ultrathin nitrided silicon oxide films. IBM J. Res. Dev. 43 (3) (1999)