J. R. Schwank

Publication Activity (10 Years)

Years Active: 2004-2004
Publications (10 Years): 0

Publications

J. A. Felix, J. R. Schwank, Daniel M. Fleetwood, M. R. Shaneyfelt, Evgeni P. Gusev
Effects of radiation and charge trapping on the reliability of high-kappa gate dielectrics. Microelectron. Reliab. 44 (4) (2004)