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Erping Li
ORCID
Publication Activity (10 Years)
Years Active: 2003-2024
Publications (10 Years): 3
Top Topics
Gallium Arsenide
Artificial Neural Network Models
Logistic Regression
Monte Carlo
Top Venues
Microelectron. J.
CoRR
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Publications
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Tiancheng Li
,
Erping Li
,
Huali Duan
,
Zhufei Chu
,
Jian Wang
,
Wenchao Chen
Artificial neural network models for metal-ferroelectric-insulator-semiconductor ferroelectric tunnel junction memristor.
Microelectron. J.
144 (2024)
Huali Duan
,
Erping Li
,
Qinyi Huang
,
Yuehang Xu
,
Wenchao Chen
Multiphysics simulation study of thermal stress effects in nanoscale FinFETs heterogeneously integrated with GaN high-power device on silicon substrate.
Microelectron. J.
150 (2024)
Tianning Zhang
,
Yee Sin Ang
,
Erping Li
,
Chun Yun Kee
,
L. K. Ang
SUTD-PRCM Dataset and Neural Architecture Search Approach for Complex Metasurface Design.
CoRR
(2022)
Oka Kurniawan
,
Man-Fai Ng
,
Wee Shing Koh
,
Zuan Yi Leong
,
Erping Li
Simplified model for ballistic current-voltage characteristic in cylindrical nanowires.
Microelectron. J.
41 (2-3) (2010)
Xiaomeng Shi
,
Kiat Seng Yeo
,
Jianguo Ma
,
Manh Anh Do
,
Erping Li
Complex Shaped On-Wafer Interconnects Modeling for CMOS RFICs.
IEEE Trans. Very Large Scale Integr. Syst.
16 (7) (2008)
Xiaomeng Shi
,
Jianguo Ma
,
Kiat Seng Yeo
,
Manh Anh Do
,
Erping Li
Equivalent circuit model of on-wafer CMOS interconnects for RFICs.
IEEE Trans. Very Large Scale Integr. Syst.
13 (9) (2005)
Hongfan Jin
,
Erping Li
,
Weiliang Yuan
,
Lewei Li
Parallel FDTD computing for emc simulation in high-speed electronics.
Int. J. Comput. Eng. Sci.
5 (3) (2004)
Beng Hwee Ong
,
Choon Beng Sia
,
Kiat Seng Yeo
,
Jianguo Ma
,
Manh Anh Do
,
Erping Li
Investigating the frequency dependence elements of CMOS RFIC interconnects for physical modeling.
SLIP
(2004)
Yaojiang Zhang
,
Fang Wu
,
Erping Li
Parallel fast multipole method for large-scale computation of electromagnetic scattering.
Int. J. Comput. Eng. Sci.
5 (2) (2004)
Enfeng Liu
,
Ruqi Han
,
Erping Li
,
Ping Bai
A novel hydrodynamic model for nanoscale devices simulation.
Microelectron. J.
34 (4) (2003)